A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
Utilizing the technique called focused ion beam – scanning electron microscopy (FIB-SEM), a study investigated the high capability thin-film solar cells which are made of Cu(In,Ga)Se2. Samples were ...
In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...
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