Device power supply (DPS) ICs have flexible force voltage and force current capacities to provide dynamic test capabilities to automated test equipment (ATE). The DPS IC is a voltage source when the ...
Fairchild fellow Timwah Luk (left) and Jifa Hao, worldwide wafer-level reliability engineer, test ICs well beyond published limits. Photo by Jeff Stevensen. South Portland, ME—Whenyou manufacture more ...
The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ...
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