The construction of compact semiconductors with reduced thickness and size is desirable for their application in microelectronic devices and transistors. However, measuring the parameters such as ...
A Rutherford backscattering spectrometer (RBS) system can be applied to the study of surface coatings. The technique permits the study of inhomogeneous surface layers, including a determination of the ...
A new technical paper titled “Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry” was published by researchers at IMEC and KU Leuven. ...
The 5.5MV Van De Graaff particle accelerator allows for neutron and proton beam studies as well as proton induced X-ray emission, Rutherford Backscattering Spectroscopy, Ion-beam implantation, ...
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