A new concept can execute the same boundary scan test pattern on various ATE systems without modification. Boundary scan is well established and widely used for various board- and system-level test ...
A new concept can execute the same boundary scan test pattern on various ATE systems without modification. Boundary scan is well established and widely used for various board- and system-level test ...
As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
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