The Scanning Tunneling Microscopy (STM) was the first technique; in fact, it was invented in 1981 by Gerd Binnig and Heinrich Rohrer at IBM Zurich and after five years they won Nobel Prize in physics.

(Nanowerk Spotlight) Conventional optical lithography is the standard and most common technique in the semiconductor industry and in the microfabrication research field. Although several approaches ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...