Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...

At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

NOTE: DO NOT open the door of the enclosure while the tip is engaged. This can damage (or destroy) the tip due to jarring and vibrations. Can be adjusted during scanning. It is good habit to check the ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...