(Nanowerk News) The roughness of a surface can make all the difference in nanoscale devices. Measuring the roughness of such delicate surfaces in the hard-to-reach places of nanodevices, however, is ...

SAN DIEGO--(BUSINESS WIRE)--Filmetrics has extended its free 3D surface-image analyzer, ProfilmOnline, to AFM and other scanning-probe applications. This cloud-based software is also ideal for ...

SAN DIEGO--(BUSINESS WIRE)--Filmetrics has announced its free online 3D surface-image viewer and analyzer, ProfilmOnline. This web-based software is ideal for viewing surface images from 3D optical ...

Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI). Software capabilities include measurements ...

The study of micro- and nanoscale surface metrology is becoming commonplace in industrial and research environments, as structures and surface features become smaller and smaller. In particular, ...

Please contact the ARC Core Labs for questions and assistance. Contact Us Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and ...

The Universal Scanning Interferometry (USI) measurement mode has been recently released by Bruker to provide universal measurement results on a broad range of surfaces for ContourX white light ...

(Nanowerk News) Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and ...